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Surface Defect Identification

Surface Inspection

Identify Anomalies Without Defined Geometries (AI Defect Detection)

Surface Defect Identification

Overview

Surface defect detection is a common Quality Control Parameter followed in almost all industries for their parts. Manual identification is tedious and expensive. Today’s machine vision systems don’t offer the accuracies and consistencies that are required. Our specially designed solution for Surface Anomaly Detection offers the combination of easy training and highly accurate detection making even the most challenging detection application a breeze.

Capabilities

What this solution delivers

Sub-mm detection

Detect scratches, dents, burrs, porosity, and stains down to 0.1mm.

Line-speed inspection

Inspect 100% of parts at production speed without becoming the bottleneck.

Self-improving AI

Models adapt to new defect types as they appear, improving over time.

Typical applications

Where it’s used

Castings & forgings
Machined & turned parts
Painted & coated surfaces
Sheet metal & strip
Glass & plastic mouldings
Cylinders & vessels
Proven in production

Case studies & app notes

Case studies

App notes

AI-Powered Inline Vision Inspection for Pharmaceutical Blister Pack PackagingPHARMAAPP NOTE

AI-Powered Inline Vision Inspection for Pharmaceutical Blister Pack Packaging

100% automated inspection of blister cavities, foil seal integrity, and print quality at full production line speed — with a complete 21 CFR Part 11 audit trail.

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Visual Inspection Automation for Pharmaceutical Vials & AmpoulesPHARMAAPP NOTE

Visual Inspection Automation for Pharmaceutical Vials & Ampoules

Automated cosmetic, container, and particulate inspection of glass vials and ampoules at injectable line speed — with a validated audit trail per USP <790> and EU GMP Annex 1.

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Bearing Ring Inspection — Inline Raceway Surface & Bore Dimensional InspectionBEARINGSAPP NOTE

Bearing Ring Inspection — Inline Raceway Surface & Bore Dimensional Inspection

Dual-pass inline inspection of inner race raceway surface defects and bore dimensions — replacing manual gauging with 100% coverage and IATF 16949-compliant per-ring traceability.

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AI-Powered Label Print InspectionAI-POWEREDAPP NOTE

AI-Powered Label Print Inspection

100% inline verification of label print quality, OCR/OCV text accuracy, barcode grades, and colour deviation (ΔE < 2) at press speeds up to 150 m/min.

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Black Dot Detection on Plastic TubesCONSUMER ELECTRONICSAPP NOTE

Black Dot Detection on Plastic Tubes

360° camera ring with AI defect detection identifying black dots, scratches, pits, and gel inclusions < 0.1 mm on plastic tubes at 30–50 fps inline.

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AI Vision Inspection for Metal Bar FabricationSTEELAPP NOTE

AI Vision Inspection for Metal Bar Fabrication

Five-station AI vision architecture covering pre-cut surface inspection, cutting accuracy, weld quality, frame assembly, and dimensional traceability — ISO 3834 and ISO 9013 compliant.

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NIR/SWIR Spectral Imaging for Automatic Polymer IdentificationINDUSTRYAPP NOTE

NIR/SWIR Spectral Imaging for Automatic Polymer Identification

SWIR camera operating at 900–1700 nm classifies PET, HDPE, PVC, PP, LDPE, PS, and black plastics at 30+ fps — achieving 95%+ accuracy regardless of colour, dirt, or shape.

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AI-Powered Final Assembly Line InspectionAI-POWEREDAPP NOTE

AI-Powered Final Assembly Line Inspection

Three-zone AI-powered architecture verifying gap & flush measurement (±0.1 mm), surface defect detection, and VIN-linked traceability on automotive final assembly — within takt time.

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AI-Powered Incoming Parts Inspection for High-Mix Precision Component Supply ChainsSEMICONDUCTORAPP NOTE

AI-Powered Incoming Parts Inspection for High-Mix Precision Component Supply Chains

Reference-based, CAD-driven vision inspection for semiconductor capital equipment receiving — scaling visual QC across thousands of SKUs without enumerating every defect type in advance.

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Have a similar application?

Send us your part and inspection goal — we’ll share the most relevant note and a feasibility view.